INSPECTION & METROLOGY /
SPECIALTY OBJECTIVES

Specialty Inspection Objectives


From our extensive line of Optem Long-Working Distance Objectives for industrial inspection and analytical wafer probing…to our LINOS mag.x UV-Vis Reflecting Objectives for FTIR spectroscopy, photolithography, ellipsometery and semiconductor inspection, Qioptiq has more than 100 years experience in delivering high-performance optics and objectives for a wide variety of imaging applications.



MACHINE VISION

Inspection & Metrology

Projection and Prepress

Semiconductors and Microelectronics

Biotech Lab Instruments

LASER INDUSTRY

SEMICONDUCTORS & MICROELECTRONICS

PHOTOGRAPHY & CINEMATOGRAPHY

PROJECTION & PREPRESS

AUTOMOTIVE

OTHER INDUSTRIAL APPLICATIONS

CUSTOMER SERVICE



 Optem Long-Working-Distance Objectives for industrial inspection and analytical wafer probing



Learn more about our specialized Objective lines:


Optem High-Resolution LWD Objectives


Optem High-
Resolution LWD
Objectives
>>>

Optem M-Plan APO LWD Objectives



Optem M-Plan
APO LWD Objectives

>>>


In addition to this extensive standard product offering, Qioptiq develops
a wide range of customized objective solutions to meet unique imaging
requirements of OEMs and researchers alike. Drawing upon more than
100-years optical design and manufacturing expertise, we can integrate
a broad range of objective technologies:

•    Specialty glass and coatings
•    Planar and zero-distortion optics
•    Apochromatic designs
•    High Numerical Apertures
•    Selective bandwidth transmission
•    Broadband spectrum from DUV to Far-IR
•    Compact designs
•    Conductive and non-conductive sleeves
•    Split-field objectives
•    Projection objectives
•    Oil-immersion objectives
•    Brightfield, darkfield and emission microscope objectives
•    Focusable objectives
•    Macro and Telescopic Objectives

To send a question, make a request, or discuss the
parameters of your objective imaging requirements, click here.

 Optem Long-Working-Distance Objectives for industrial inspection and analytical wafer probing


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